This Article is From Jun 22, 2016

Father-Son Get Away With Mercedes During Test Drive In Delhi, Arrested

Father-Son Get Away With Mercedes During Test Drive In Delhi, Arrested

The accused approached a showroom representative and drove away with the Mercedes Benz model on the pretext of test drive. (Representational Image)

New Delhi: A father-son duo who allegedly made away with a Mercedes Benz car from a showroom in southwest Delhi's Dwarka area on the pretext of test drive have been arrested and the car recovered from their possession, police said on Tuesday.

The incident took place on May 6, when the accused, identified as Anil Anand (54) and Sahil Anand (23), approached a showroom representative and drove away with the Mercedes Benz model on the pretext of test drive.

Based on a tip-off, a trap was laid and the accused were arrested from Gurgaon on Monday. The car was recovered from their possession, DCP (southwest) Surendra Kumar said.
 
.